Download e-book for kindle: Applied Scanning Probe Methods V: Scanning Probe Microscopy by Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann

By Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann (auth.), Professor Bharat Bhushan, Satoshi Kawata, Professor Dr. Harald Fuchs (eds.)

ISBN-10: 3540373152

ISBN-13: 9783540373155

ISBN-10: 3540373160

ISBN-13: 9783540373162

The scanning probe microscopy ?eld has been swiftly increasing. it's a difficult job to gather a well timed evaluate of this ?eld with an emphasis on technical dev- opments and business purposes. It turned obvious whereas modifying Vols. I–IV that a huge variety of technical and applicational features are current and swiftly - veloping around the world. contemplating the good fortune of Vols. I–IV and the truth that additional colleagues from best laboratories have been able to give a contribution their most modern achie- ments, we determined to extend the sequence with articles touching ?elds now not coated within the prior volumes. The reaction and help of our colleagues have been first-class, making it attainable to edit one other 3 volumes of the sequence. unlike to- cal convention court cases, the utilized scanning probe equipment intend to provide an summary of contemporary advancements as a compendium for either useful purposes and up to date uncomplicated examine effects, and novel technical advancements with appreciate to instrumentation and probes. the current volumes disguise 3 major parts: novel probes and methods (Vol. V), charactarization (Vol. VI), and biomimetics and commercial functions (Vol. VII). quantity V comprises an summary of probe and sensor applied sciences together with built-in cantilever suggestions, electrostatic microscanners, low-noise equipment and superior dynamic strength microscopy strategies, high-resonance dynamic strength - croscopy and the torsional resonance strategy, modelling of tip cantilever platforms, scanning probe tools, techniques for elasticity and adhesion measurements at the nanometer scale in addition to optical purposes of scanning probe innovations in keeping with near?eld Raman spectroscopy and imaging.

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Additional resources for Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques

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371 Contents – Volume IV 23 24 25 26 27 28 29 30 Scanning Probe Lithography for Chemical, Biological and Engineering Applications Joseph M. Kinsella, Albena Ivanisevic . . . . . . . . 1 Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) Bharat Bhushan, Carmen LaTorre . . . . . . . . . 35 Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography Jayne C. Garno, James D. Batteas . . . .

159 Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection Hans Peter Lang, Martin Hegner, Christoph Gerber . . . . 183 Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices B. Gotsmann, U. Dürig . . . . . . . . . . . . 215 Applications of Heated Atomic Force Microscope Cantilevers Brent A. Nelson, William P. King . . . . . . . . . . 251 Subject Index . . . . . . . . . . . . . . . . . . . . .

Additional layers on top of the cantilever structure include dielectric layers, like silicon dioxide or nitride, and can be utilized as a mask for implantation. A pre-manufactured tip is either mounted or glued to the cantilever end or it can be micromachined directly on the cantilever by additional steps. , the piezoresistor by a low-input-impedance current amplifier, or to apply a constant electrical current to the resistor and measure the voltage drop with a highinput-impedance amplifier. The latter approach can be easily realized in CMOS technology, as MOS-transistors are commonly used for high-input-impedance (instrumentation) amplifiers.

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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques by Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann (auth.), Professor Bharat Bhushan, Satoshi Kawata, Professor Dr. Harald Fuchs (eds.)

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