By Professor Bharat Bhushan, Professor Dr. Harald Fuchs, Professor Dr. Sumio Hosaka (auth.)
This quantity examines the actual and technical origin for contemporary development in utilized near-field scanning probe innovations. It constitutes a well timed finished review of SPM purposes, now that commercial functions span topographic and dynamical floor experiences of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. After laying the theoretical heritage of static and dynamic strength microscopies, together with sensor expertise and tip characterization, contributions element functions equivalent to macro- and nanotribology, polymer surfaces, and roughness investigations. the ultimate half on business learn addresses detailed functions of scanning strength nanoprobes comparable to atomic manipulation and floor amendment, in addition to unmarried electron units in line with SPM. Scientists and engineers both utilizing or making plans to take advantage of SPM thoughts will enjoy the foreign viewpoint assembled within the book.
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Extra info for Applied Scanning Probe Methods
Science 267:68-71 9. Bezanilaa M, Drake B, Nudler E, Kashlev M, Hansma PK, Hansma HG (1994) Motion and enzymatic degradation of dna in the atomic force microscope. Biophys J 67:2454-2459 10. Jiao Y, Cherny DI, Heim G, Jovin TM, SchafferTE (2001) Dynamic interactions ofp53 with DNA in solution by time-lapse atomic force microscopy. J Mol BioI 314:233-243 11.
As stated before, in principle any of the internal parameters can be used for feedback to the tip-sample distance; in the AM mode the amplitude signal is used. A certain amplitude (smaller than the free oscillation amplitude) at a frequency close to the resonance of the cantilever is chosen, the tip is approached towards the surface under investigation, and the approach is stopped as soon as the set-point amplitude is reached. The oscillationphase is usually recorded during the scan; however, the shift of the resonant frequency of the cantilever cannot be directly accessed, since this degree of freedom is blocked by the external excitation at a fixed frequency.
Although, as soon as the repulsive force regime is reached, the instability occurs due to the induced positive frequency shift. Consequently, a large jump in the phase curve from values smaller than 90° towards values larger than 90° is observed. The small change in the amplitude curve is not resolved in the simulated curves in Fig. 9; however, this can be clearly seen in the experimental curves in Fig. 10. In Fig. 10 corresponding experimental amplitude and phase curves are depicted. 95 kHz. Qualitatively, all prominent features of the simulated curves can also be found in the experimental data sets.
Applied Scanning Probe Methods by Professor Bharat Bhushan, Professor Dr. Harald Fuchs, Professor Dr. Sumio Hosaka (auth.)